“Monitoring of interfacial reactions using discharging current from graphene FETs,” presented at IEEE SISC, Washington, Dec. 2013.

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“Characterization of ultra-thin dielectric using time domain reflectometry” presented at Int. Workshop on Dielectric Thin Films. (IWDTF) , 2013.

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“Interfacial defects at top gate graphene FETs investigated using a novel discharging current measurement method”, presented at Int. Workshop on Dielectric Thin Films. (IWDTF) , 2013.

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“Highly sensitive Al2O3 passivated CVD graphene photodetectors for UV to IR region”, presented at Int. Workshop on Dielectric Thin Films. (IWDTF) , 2013.

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