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exel2014-09-02 10:22:562014-09-02 10:22:59“High-k dielectrics”, Proc. SPIE Int. Soc. Opt. Eng. 3881, 24,1999
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exel2014-09-02 10:14:212014-09-02 10:14:43" Nitrogen implantation to suppress growth of interfacial oxide in MOCVD BST and sputtered BST films,” MRS spring meeting, 1999
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exel2014-09-02 10:11:492014-09-02 10:11:52"Sputtered BST Thin Films for Alternative High K Gate Dielectrics,” Proceedings of American Vacuum Society Symposium, Austin, 1998
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exel2014-09-02 10:10:442014-09-02 10:10:50 "Leakage characteristics of TiO2 films,” Proceedings of American Vacuum Society Symposium, Austin, 1998
