“Characterization of ultra-thin dielectric using time domain reflectometry” presented at Int. Workshop on Dielectric Thin Films. (IWDTF) , 2013.

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“Interfacial defects at top gate graphene FETs investigated using a novel discharging current measurement method”, presented at Int. Workshop on Dielectric Thin Films. (IWDTF) , 2013.

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“Mechanisms of Ambient Dependent Mobility Degradation in the Graphene MOSFETs on SiO2 Substrate,” Silicon Nanoworkshop, Hawaii, 2012.

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“A Study on the Electrical Characterization methods for CdS channel MOSFETs”, presented at 18th Korean Conference on Semiconductors, 2011.

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“Short Pulse Characterization of Hysteric Characteristics of Graphene Field Effect Transistor”,presented at 18th Korean Conference on Semiconductors, 2011.

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