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exel2014-09-02 16:16:062014-09-02 16:16:15 “Impact of the bottom interfacial layer on the threshold voltage and device reliability of fluorine incorporated PMOSFET with high-k/metal electrode,”, Proc. of IRPS, p.374, 2007.
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exel2014-09-02 15:54:082014-09-02 15:54:11“Thermal stability of metal electrodes and its impact on gate dielectric characteristics”, Ext. Abs. of SSDM, p.1134 , 2006.
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exel2014-09-01 12:53:202014-09-01 12:53:24"Investigation of threshold voltage instability induced by gate bias stress in ZnO nanowire field effect transistors", Nanotechnology, 23, 485201 (2012).
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exel2014-09-01 11:13:492014-09-01 11:13:53“Electronic properties associated with conformational changes in azobenzene-derivative molecular junctions”, Organic Electronics 12, p.2144 , Sep. 2011.
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exel2014-09-01 10:54:592014-09-01 10:55:06"Enhanced charactteristics of pentacene field-effect transistors with graphene electrodes and substrate treatments," Appl. Phys. Lett. 99, 083306, Aug. 2011.
