“A Model for Negative Bias Temperature Instability (NBTI) in Oxide and High-k pFETs,” Proc. of Symposium on VLSI Technology, p.208, 2004

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“Evaluation of Negative Bias Temperature Instability in HfO2 Gate Dielectric Stacks with Tungsten Gates,” IEEE Electron Dev. Lett., v.25, p153, 2004

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