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exel2014-09-02 14:23:232014-09-02 14:23:39“Dual Metal Gate CMOS Using CVD Metal Gate Electrode,” Proceedings of Electronic Material Conference, 2004. (Invited)
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exel2014-09-02 13:55:152014-09-02 13:56:11 “A Model for Negative Bias Temperature Instability (NBTI) in Oxide and High-k pFETs,” Proc. of Symposium on VLSI Technology, p.208, 2004
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exel2014-09-02 11:01:332014-09-02 11:01:36 “W/HfO2 gate stacks with Tinv~1.2nm and low charge trapping,” Ext. Abs. of SSDM, 2003
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exel2014-08-29 11:38:312014-08-29 11:38:34 “Evaluation of Negative Bias Temperature Instability in HfO2 Gate Dielectric Stacks with Tungsten Gates,” IEEE Electron Dev. Lett., v.25, p153, 2004