“Detection of Electron Trap Generation Due to Constant Voltage Stress on High-κ Gate Stacks”, Proc. of IRPS, p.169 , 2006.

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“Detection of Trap Generation in High-k Gate Stacks due to Constant Voltage Stress,” Proc. of Int. Integrated Rel. Workshop, p.78, 2005.

“Electron Trap Generation in High-k Gate Stacks by Constant Voltage Stress”, IEEE Trans. Dev. Mat. Reliability, 6, p.123-131, 2006.

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