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exel2014-09-02 17:09:432014-09-02 17:09:46 “Effects of Gate Process on NBTI Characteristics of TiN Gate FinFET," Int. Reliability Physics Symposium (IRPS), L.A., Apr., 2012.
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exel2014-09-01 11:18:402014-09-01 11:18:42"Process dependent N/PBTI characteristics of TiN Gate finFET," IEEE Elect. Dev. Lett.,33(7), p.937, Jul. 2012.
