“Effective Minimization of Charge-trapping in High-k gate Dielectrics with an Ultra-short Pulse Technique,” 7th International Conference on Solid-State and Integrated Circuits Technology. 1, p.470, 2004

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“Ultra-Short Pulse Current-Voltage Characterization of the Intrinsic Characteristics of High-κ Devices,” Jpn. J. of Appl. Phys., vol. 44, No. 4B, 2437, 2005.