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exel2014-09-02 17:09:432014-09-02 17:09:46 “Effects of Gate Process on NBTI Characteristics of TiN Gate FinFET," Int. Reliability Physics Symposium (IRPS), L.A., Apr., 2012.
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exel2014-08-25 17:45:352014-08-28 13:11:21"Strong Field Dependence of Hot Carrier Effects in Highly Scaled Short Channel FinFETs," Submitted to Microelectronic Engineering (2014).
