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exel2014-09-02 14:57:462014-09-02 15:00:28“Physical Characterization of Novel Metal Electrodes for Hf-based Transistors,” AIP Conf. Proc. 788, p.136, 2005.
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exel2014-08-29 14:14:132014-08-29 14:14:20“Thermal response of Ru electrodes in contact with SiO2 and Hf based high-K gate dielectrics,” J. Appl. Phys. 98, p.043520, 2005
