“Characterization of ultra-thin dielectric using time domain reflectometry” presented at Int. Workshop on Dielectric Thin Films. (IWDTF) , 2013.

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“Interfacial defects at top gate graphene FETs investigated using a novel discharging current measurement method”, presented at Int. Workshop on Dielectric Thin Films. (IWDTF) , 2013.

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“Mechanisms of Ambient Dependent Mobility Degradation in the Graphene MOSFETs on SiO2 Substrate,” Silicon Nanoworkshop, Hawaii, 2012.

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“Effects of Gate Process on NBTI Characteristics of TiN Gate FinFET,” Int. Reliability Physics Symposium (IRPS), L.A., Apr., 2012.

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“Capacitance-voltage measurement of leaky Al2O3 MIM capacitor using Time Domain Reflectometry (TDR) ,” Korea Semiconductor Conference (KSC), Feb., 2012.

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