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exel2014-09-02 17:28:362014-09-02 17:28:39"Monitoring of interfacial reactions using discharging current from graphene FETs," presented at IEEE SISC, Washington, Dec. 2013.
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exel2014-09-02 17:27:162014-09-02 17:27:19“Interfacial defects at top gate graphene FETs investigated using a novel discharging current measurement method”, presented at Int. Workshop on Dielectric Thin Films. (IWDTF) , 2013.
