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태그 보관용: D. Wouters

글

“A study of the leakage current in TiN/HfO2/TiN capacitors ,” Microelectronic Engineering, v.95, p.71-73, Jul. 2012.

2014년 9월 1일/카테고리: Journals /작성자: exel

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https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif 0 0 exel https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif exel2014-09-01 11:20:212014-09-01 11:20:24 "A study of the leakage current in TiN/HfO2/TiN capacitors ," Microelectronic Engineering, v.95, p.71-73, Jul. 2012.

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