“Dipole-Induced Gate Leakage Reduction in Scaled MOSFETs with a Highly Doped Polysilicon/Nitrided Oxide Gate Stack,” Submitted to Microelectronic Engineering, (2014).

“Capacitance analysis of highly leaky Al2O3 MIM capacitor using time domain reflectometry,” IEEE Electron Dev. Lett., 33(9), p. 1303-1305, Jul. 2012.

Download