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exel2014-09-02 14:33:152014-09-02 14:33:18 “Characterizing Hf-Based Bulk Film Properties Using Ultra-short Pulse I-V Measurements,” Proc. of SISC, 2004.
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exel2014-09-02 14:19:222014-09-02 14:19:25 “Ultra-Short Pulse I-V Characterization of the Intrinsic Behavior of High-k Devices,” Ext. Abs. of SSDM,p.216, 2004
