S.C. Kang, H.W. Jung, S.J. Chang, S.M. Kim, S.K. Lee, B.H.Lee, H.C. Kim, Y.S. Noh, S.H. Lee, S.I. Kim, H.K. Ahn, J.W. Lim, "Quantitative defect density extraction method for Metal–Insulator–Metal Capacitor," Nanomaterials 10(11), p.2116 (2020).
목록보기
Powered by KBoard