Meet the Our Professor

Byoung Hun Lee

Byoung Hun Lee


Professional Activities

Award and recognition

Best Paper Award, Korea Semiconductor Conference, 2013
Best Poster Paper Award: Workshop on Frontiers in Electronics, 2011
Research Innovation award, Nano Korea 2011
Best Paper Award; Symposium on Solid State Device and Materials, 2008

Journal Editorship

Scientific Reports, 2015- 2021, Editorial board member
Electronic Materials Letters, 2012-2021, Editorial committee
Nano convergence, 2013- 2017, Editorial board member

J. of Materials, 2012-2014, Editorial committee
Scientific World Journal, 2013, Editorial board member
Microelectronics Engineering, 2006-2011, Managing guest editor
IEEE Trans. Device and Materials Reliability, 2008-2009, Guest editor
Journal of Semiconductor Technology and Science, 2009, Editor

Technical society membership

IEEE and Electron Device Society, senior member, since 2005

Technical community activity

Symposium on VLSI Technology, Technical Committee, 2008-2021
ENGE, Program Chair/ Symposium/Session Organizer, 2013-2020
IEEE Semiconductor Interface Specialist Conference(SISC), Technical committee, 2005-2007. 2014-2016
Nano Korea, Technical committee, 2015-2016
VLSI-TSA, Program committee, 2006-2015
IUMRS-ICAM,Session organizer, 2010, Symposium Organizer, 2015
IWDTF, Technical committee, 2011, 2013, 2015, 2017
Int. Conf. on Solid State Devices and Materials, Vice session chair, 2009-2012
ISIF, Session Organizer, 2013
Int. workshop on Process Failure Analysis(IPFA), Publication chair, 2011
IUMRS, IEEE Advanced Gate Stack Technology, 2004- 2009
– Tech. Chair (06,07)/General Chair(04,05,08)/Executive committee(09)
Int. Reliability Physics Symposium, Sub-committee member, 2006-2007


H-index = 57, total cumulative citation > 11,000
More than 290 journal and 434 conference publications during 1995-2018 in
Graphene Processes and Device characterizations
Novel electronic devices (NEM switch, Ferroelectric switch, touch sensor)
High performance logic devices and processes
Gate stack technology
Reliability and test methodology
Memory (DRAM, Flash)
Invited talks at various conferences

SISC(’19), Graphene 2018 (’18) TMS (’17), Korea-EU Nanoforum (’16), ESSDERC(’16), CSTIC(’15), IMRC(’15), IMRS(’14), 
CSTIC(’14), UKC (’13), CSTIC(’14), UKC (’13), SEMINAR (’12), US-KOR workshop(’12), ISIF (’12), CMOSET(’12)
IECS (’10), AVS (’10), NGC(’11), ,
ISTC (‘09), ECS-spring (‘09), ICICDT (‘09)
IWDTF (‘08), IMRS (‘08), ISTC (‘07), ECS (‘06), NMDC(‘06), ICM(‘06),
ECS (‘05), NATO workshop (‘05), ICICDT (’05), ISTC (‘05), IEDM (’04)
Tutorials/ Short course
MRS (2006), SSDM(2011)


The Univ. of Texas at Austin, Electrical and Computer Engineering, Ph.D (1997 – 2000)

Korea Advanced Institute of Science and Technology, Physics, M.S. (1989 – 1992)

Korea Advanced Institute of Science and Technology, Physics, B.S. (1986 – 1989)