| Current Course :
E-mail Address : Phone Number : |
Ph. D Course
82-62-715-2347 |
Research Interest
- Reliability of high-k MOSFET & FinFET
- Electrical characterization method for semiconductor devices
- Gate Stack Technology
Education
- since 2010 : Ph.D, Dept. of Nanobio Materials and Electronics, GIST
- 2011. 3~2011.8: IMEC, Device Reliability and Electrical Characterization team (Internship program)
- 2008 – 2010 : M.S., Dept. of MSE, GIST
- 2003 – 2008 : B.S., Dept. of MSE, Inha University
Publication
Other Expertise
Experience
- 2011.3~2011.8 : Internship program, IMEC, Device Reliability and Electrical Characterization team (Leuven, Belgium)
Technical Skills
- Gate dielectric reliability
- Electrical characterization of semiconductor devices
Course Work
Master
- Organic Materials for Electronics and Photonics I
- Solid State Electrochemistry
- Semiconductor Processing
- Solid-State Physics
- Advanced Thermodynamics
- Energy Conversion Chemistry
- Nanoelectronics
- Lithography Process
- Nanomaterials
- Device physics for nanoscale solid state devices
Ph. D
- Post CMOS Hybrid Device Technology
- Electrical Characterization for AdvancedNanoscale Devices
- Advanced Electron Microscopy
- Semiconductor Devices on Single Crystalline and Unconventional Substrate
- Introduction to Materials Science and Engineering
- Introduction to Patents
