국내
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37 |
김윤지, 김소영, 정욱진, 박우진, 이상경, 이병훈, "고압수소열처리 조건에 따른 그래핀 전계효과소자의 특성 최적화", 23rd Korean Conference on Semiconductors(KCS), 2016
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국내
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36 |
김승모, 정욱진, 임성관, 강수철, 이병훈, "Tunnel FET의 고유한 열화메카니즘에 관한 연구", 23rd Korean Conference on Semiconductors(KCS), 2016
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국내
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35 |
강수철, 김용훈, 정욱진, 박우진, 김승모, 이병훈, "FinFET의 Bipolar AC Stress에 의한 Reliability 특성", 23rd Korean Conference on Semiconductors(KCS), 2016, Best poster award.
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국제
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34 |
U. Jung, S.M. Kim, D. Lim, K.E. Chang, Y.J. Kim, S.C. Kang, S.K. Lim, C. Choi and B.H. Lee, “Mechanism of subthreshold swing degradation in p-type tunnel FETs", SISC, (2015)
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국제
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33 |
Y.J. Kim, S.Y. Kim, U. Jung, S.K. Lee, K.E. Chang, C. Cho and B.H. Lee, "Fermi level of graphene under a metal contact modulated by high pressure hydrogen anneal", SISC, (2015)
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국제
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32 |
S.K. Lee, U. Jung, C. Cho, T.J. Yoo, A.N.R. Reza, H.I. Lee, and B.H. Lee, "The role of interface charge traps in the RF operation of graphene devices", SISC, (2015)
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국제
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31 |
Y.J. Kim, U. Jung, and B.H. Lee, "Influence of high pressure oxygen annealing on graphene field-effect transistors with Al2O3 passivation layer", IUMRS, (2015)
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국내
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30 |
이상경, 김윤지, 정욱진, 김용훈, 유태진, 이병훈, “Buried gate Graphene FET의 게이트 절연막 scaling 연구”, 22nd Korean Conference on Semiconductors(KCS), 2015
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국내
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29 |
박우진, 김용훈, 이상경, 정욱진, 양진호, 조천흠, 김윤지, 임성관, 이병훈, “MoS2 전계효과 트랜지스터의 컨택 저항 개선 방법”, 22nd Korean Conference on Semiconductors(KCS), 2015
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국내
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28 |
강수철, 이영곤, 김용훈, 정욱진, 박우진, 김윤지, 이병훈, “FinFET의 AC Stress Reliability 특성”, 22nd Korean Conference on Semiconductors(KCS), 2015
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국내
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27 |
김용훈, 정욱진, 강수철, 이영곤, 이병훈, “TDR 분석법을 이용한 미세전계효과소자의 Effective Moliblity 추출 방법”, 22nd Korean Conference on Semiconductors(KCS), 2015
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국내
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26 |
정욱진, 김윤지, 김용훈, 김소영, 이병훈, “Top gate graphene FET의 Fermi level과 계면결함 밀도의 상관관계 연구”, 22nd Korean Conference on Semiconductors(KCS), 2015, Best poster award.
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국제
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25 |
W.J.Park, Y.H.Kim, S.K.Lee, U.Jung, J.H.Yang, C.Cho, Y.J.Kim, S.K.Lim, I.S. Hwang, H.B.R.Lee, and B.H.Lee, “Contact Resistance Reduction using Fermi Level De-pinning Layer for MoS2 FETs”, Tech. Dig of IEDM, (2014).
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국제
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24 |
W.J.Park, Y.H.Kim, S.K.Lee, U.Jung, J.H.Yang, C.Cho, Y.J.Kim, S.K.Lim, and B.H.Lee, “Contact Resistance Reduction for MoS2 FETs with Insulating Layers”, 44th IEEE Semiconductor Interface Specilaists Conference (SISC), (2014).
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국제
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23 |
K.E.Chang, U.Jung, T.J.Yoo, J.Noh, B.H.Lee, “Gate-tunable Wide Bandwidth Photodetector using Graphene/Silicon Schottky Contact", Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE), (2014), Best poster award.
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국제
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22 |
U.Jung, Y.Kim, S.Lee B.H.Lee, “Novel Method to Extract the Defect Levels of Charge Traps at Top Gate Graphene FETs", Int. Conf. on Electronic Materials and Nanotechnology for Green Environment (ENGE), (2014)
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국내
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21 |
정욱진, 이병훈 “Effect of duty cycle control in discharge current analysis (DCA) method used to assess the interfacial qualities of graphene FETs”, The 1st Korean Graphene Symposium, (2014).
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국내
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20 |
김윤지, 이영곤, 강창구, 정욱진, 이상철, 이상경, 이병훈, “Optimization of Integration Process for Stabilized Graphene MOSFET”, 21st Korean Conference on Semiconductors(KCS), 2014.
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국내
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19 |
이재은, 정욱진, 이병훈, “Interfacial Charge Density measurement for Graphene Transistor using Discharge Current Analysis (DCA) Method”, 21st Korean Conference on Semiconductors(KCS), 2014.
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국제
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18 |
U.Jung, J.E.Lee, Y.G.Lee, Y.J.Kim, B.H.Lee*, "Monitoring of interfacial reactions using discharging current from graphene FETs", IEEE SISC, Washington, (2013).
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국제
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17 |
C.G.Kang, S.H.Choe, S.K.Lee, U.Jung, W.Park, Y.G.Lee, T.J.Yoo, and B.H.Lee, “Highly sensitive Al2O3 passivated CVD graphene photodetectors for UV to IR region”, Int. Workshop on Dielectric Thin Films. (IWDTF) , (2013).
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국제
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16 |
U.Jung, J.E. Lee, Y.G. Lee, J.J. Kim, Y.H. Kim, and B.H.Lee*, “Interfacial defects at top gate graphene FETs investigated using a novel discharging current measurement method”, Int. Workshop on Dielectric Thin Films. (IWDTF) , (2013).
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국제
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15 |
Y.H. Kim, S.H.C. Baek, C.H. Jeon, Y.G. Lee, J.J. Kim, U.J. Jung, S.H. Lee, and B.H. Lee, “Characterization of ultra-thin dielectric using time domain reflectometry" Int. Workshop on Dielectric Thin Films. (IWDTF) , (2013).
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국제
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14 |
W.J. Park, Y.G. Lee, J.J. Kim, S.K. Lee, C.G. Kang, C. Cho, S.K. Lim, U. Jung, W.K. Hong, and B.H.Lee, “Reliability Characteristics of MoS2 FETs”, Int. Conf. on Solid State Device and Materials(SSDM), (2013)
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국제
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13 |
B.H. Lee, Y.G.Lee, C.G.Kang, U.J.Jung, S.C.Lee, Y.J.Kim, “Electrical characterization of Graphene Field Effect Transistor”, UKC, (2013), invited.
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국내
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12 |
장경은, 김진주, 김민우, 이상경, 정욱진, 김용훈, 이영곤, 이병훈, “Temperature effect on the intrinsic reliability of HfxAl1-xOy dielectric”, 20th Korean Conference on Semiconductors(KCS), (2013).
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국내
|
11 |
정욱진, 김진주, 이재은, 이영곤, 김용훈, 강창구, 장경은, 이병훈, “연속적인 펄스를 이용한 Graphene channel MOSFETs 결함의 전기적 분석방법 연구”, 20th Korean Conference on Semiconductors(KCS), (2013).
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국내
|
10 |
이재은, 정욱진, 김진주, 이영곤, 김용훈, 강창구, 장경은, 이병훈, "Majority Carrier 종류에 따른 Graphene channel의 펄스응답전류 특성 분석”,20th Korean Conference on Semiconductors(KCS), (2013).
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국제
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9 |
Y.G. Lee, C.G. Kang, C. Cho, Y.H. Kim, H.J. Hwang, J.J.Kim, U.J. Jung, E.J.Park, M.W.Kim, B.H. Lee, "Mechanisms of Ambient Dependent Mobility Degradation in the Graphene MOSFETs on SiO2 Substrate," Silicon Nanoworkshop (SNW), (2012).
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국내
|
8 |
Y.H.Kim, Y.G.Lee, J.J.Kim, U.Jung, S.C.Song, B.H.Lee, “Capacitance-voltage measurement of leaky Al2O3 MIM capacitor using Time Domain Reflectometry (TDR)", 19th Korea Semiconductor Conference (KSC), (2012).
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국제
|
7 |
Y.G. Lee, C.G. Kang, Y.H. Kim, C.H. Cho, U.J. Jung, S.K. Lee, B.H. Lee, "Study on the Origin of Hysteretic Characteristics of Graphene Field Effect Transistor," IEEE SISC, (2011).
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국제
|
6 |
B.H.Lee, Y.G.Lee, C.G. Kang, H.J.Hwang, Y.H. Kim, J.J. Kim, U.J. Jung, “Electrical Characterization Methods for graphene MOSFET,” Workshop on Nano and Giga Challenges, Moscow, (2011), Invited.
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국내
|
5 |
Y.G. Lee, C.G. Kang, U.J. Jung, J.J. Kim, H.J. Hwang, H.J. Chung, H. Yang, S. Seo and B.H. Lee "Short Pulse Characterization of Hysteric Characteristics of Graphene Field Effect Transistor", 18th Korean Conference on Semiconductors (KCS), (2011).
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국내
|
4 |
U.J. Jung, Y.G. Lee, J.J. Kim, I. Mejia, A. Salas-Villasenor, M. Quevedo-Lopez, J. Kim and B.H. Lee "A Study on the Electrical Characterization methods for CdS channel MOSFETs", 18th Korean Conference on Semiconductors (KCS), (2011).
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국제
|
3 |
Y.G. Lee, C.G. Kang, S.K. Lee, K.J. Choi, C.H. Cho, H.J. Hwang, S.Y. Lee, S.K. Lim, U.J. Jung, and B.H. Lee, "Characteristics of Very Low Temperature ALD Al2O3 Gate Dielectric for Top Gate Graphene MOSFET Applications", Ext. Abs. of Int. Workshop on Dielectric Thin Film (IWDTF), p.21, (2011).
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국제
|
2 |
B.H. Lee, H.J. Hwang, Y.G. Lee, U.J. Jung, "Feasibility of Mechanical Switch Device using a Graphite Electrode", IMRS, Cancun, (2010), Invited.
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국제
|
1 |
B.H. Lee, C.H. Cho, S.K. Lim, S.Y. Lee, H.J. Hwang, Y.G. Lee, U.J. Jung, C.G. Kang, "Feasibility of Wrinkle Free Graphene Process", Abs. of American Vac. Soc. Symposium, Albuquerque, p.61, (2010), Invited
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