Advanced electrical characterization methods for nano scale devices

Goal

This class covers advanced electrical characterization methods for electronic devices so that the student can utilize these methods in their research with good knowledge on the validity and limit of each method. 30% of class work will be allocated to the actual device measurement analysis.

Text book

a. Semiconductor material and device characterization, 3rd edition, D.K.Schroder, IEEE Press, John Wiley & Sons, Inc., 2006

References

a. CMOS circuit design, layout and simulation, R.J. Baker, IEEE Press, John Wiley & Sons, Inc., 2005
b. Electrical and thermal characterization of MESF

Prerequisite

–

Exams

TBD

Syllabus

(Fall, 2017)

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Note HW

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