Advanced electrical characterization methods for nano scale devices (2017, Fall)
Goal
This class covers advanced electrical characterization methods for electronic devices so that the student can utilize these methods in their research with good knowledge on the validity and limit of each method. 30% of class work will be allocated to the actual device measurement analysis.
Text book
a. Semiconductor material and device characterization, 3rd edition, D.K.Schroder, IEEE Press, John Wiley & Sons, Inc., 2006
References
a. CMOS circuit design, layout and simulation, R.J. Baker, IEEE Press, John Wiley & Sons, Inc., 2005
b. Electrical and thermal characterization of MESF
Prerequisite
–
Exams
TBD
Syllabus
(Fall, 2017)
| Class | Topic | Remarks |
|---|---|---|
| 1st | Introduction | |
| 2nd | Basics of electronics (R, L, C) | |
| 3rd | Basisc of Electronics (grounding) | |
| 4th | Impendence analyzer – capacitor characterization | |
| 5th | Parameter analyzer – IV characterization (Id-Vd, Id-Vd) | |
| 6th | Advanced transistor analysis (GIDL, DIBL etc) (Lab) | |
| 7th | Interface characterization | |
| 8th | Midterm exam | |
| 9th | Interface characterization (Lab) | |
| 10th | Interface characterization | |
| 11th | Reliability physics (Charge trapping – BTI, HCE) | |
| 12th | Reliability physics (TDDB, TZDB) | |
| 13th | Characterization of SOI devices (pulse IV, Self Heating) | |
| 14th | Term project presentations I | |
| 15th | Term project presentations II | |
| 16th | Final exam |
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