Advanced Device Analysis (2010, Fall)
This class covers basic and advanced electrical characterization methods for electronic devices so that the student can utilize these methods in their research with good knowledge on the validity and limit of each method. Also, this class will teach student how to understand the technical results in the literature using the materials taught in the class. Undergraduate level understanding on MOSFET operation is needed. Understanding on the physics of semiconductor materials and device is recommended as a prerequisite, but not required. Syllabus (Spring, 2009)
No major text book will be assigned. The class will be given a list of reference papers and a course material before each class. Suggested reference books for further reading
Semiconductor material and device characterization, 3rd edition, D.K.Schroder, IEEE Press, John Wiley & Sons, Inc., 2006,
CMOS circuit design, layout and simulation, R.J. Baker, IEEE Press, John Wiley & Sons, Inc., 2005
Electrical and thermal characterization of MESFETs, HEMTs and HBTs, R.Anholt, Artech house, 1995
After taking this class, student will be able to understand various electrical data presented in the literature and critically review the validity of those data.