https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-03 14:40:282014-09-03 14:40:31"반도체 장치의 검사방법및 이에 사용되는 프로빙 어셈블리", US patent application No. 2013-0120988 , 2014. (사사: SAMSUNG System LSI, IB-201305-020-1-US0, 과기원관리번호: IP12110705)