https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 14:18:162014-09-02 14:18:19 “Trapping/de-trapping gate bias dependence of Hf-silicate dielectrics with poly and TiN gate electrode,” Ext. Abs. of SSDM, p.214, 2004