https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 15:15:192014-09-02 15:15:22,“Transient charging effects and its implication to the reliability of high-k dielectrics,” NATO Workshop on defect in high-k dielectrics, St. Petersburg, 2005. (Invited)