https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 15:45:432014-09-02 15:45:46“Thermally Stable N-Metal Gate MOSFETs Using La-Incorporated HfSiO Dielectric”, Proc. of Symp. on VLSI Tech., p.16, 2006.