https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 16:12:452014-09-02 16:13:04 “Test Structures for Accurate RF C-V measurement for Nano-Scale CMOSFETs with HfO2 and TiN Tetal Gate”, ICMTS, 2007.