https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 10:26:282014-09-02 10:26:32 "Temperature effect on the reliability of ZrO2 gate dielectric deposited directly on silicon,” Proceedings of International Reliability Physics Symposium, 2000