https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 17:15:402014-09-02 17:15:54“Temperature effect on the intrinsic reliability of HfxAl1-xOy dielectric”, presented at 20th Korean Conference on Semiconductors(KCS), 2013.