https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 14:17:272014-09-02 14:17:32“Temperature effect of constant bias stress on MOSFET with HfSiON gate dielectric,” Ext. Abs. of SSDM, p.24, 2004