https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 16:50:102014-09-02 16:50:12“Reliability characterization methods for MOSFETs with metal electrode/high-k dielectric stack", Proc. of ICICDT, 2009. (Invited)