https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 14:30:202014-09-02 14:30:23 “Recovery of NBTI degradation in HfSiON /Metal Gate Transistors,” Proc. of Int. Rel. Workshop, p. 132, 2004.