https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 10:22:032014-09-02 10:22:06 "MOSCAP and MOSFET characteristics using ZrO2 gate dielectric deposited directly on Si,” Tech. Dig. of Int. Electron Device Meetings, 1999