https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 15:34:552014-09-02 15:34:59 “Intrinsic Threshold Voltage Instability of the HfO2 Gate Stack NMOS Transistors,” Proc. of IRPS, p.179 , 2006.