https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 17:27:162014-09-02 17:27:19“Interfacial defects at top gate graphene FETs investigated using a novel discharging current measurement method”, presented at Int. Workshop on Dielectric Thin Films. (IWDTF) , 2013.