https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 16:00:122014-09-02 16:00:15“Improved passivation and characterization of the Ge/HfSiO interface enabling surface channel Ge pFETs”, discussed at SISC, 2006.