https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 14:50:372014-09-02 14:50:40 “Implication of polarity dependence degradation on NMOSFET with polysilicon/Hf-silicate gate stack ,” Proc. of IRPS, p.636, 2005.