https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 15:28:312014-09-02 15:28:34“Hot carrier reliability study of high-k MOSFET after high pressure pure D2 annealing and subsequent annealing in N2,” SISC, 2005.