https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 14:14:342014-09-02 14:14:44“Hot carrier reliability of HfSiON PMOSFETs with Metal gate,” International symposium on the physical and failure analysis of integrated circuits, p.157,2004