https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 14:11:392014-09-02 14:11:42“Hot Carrier Reliability of HfSiON NMOSFETs with Poly and TiN metal gate,” Proc. of Device Research Conference, p., 2004