https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 15:00:562014-09-02 15:00:59“Electrical Characterization Methodologies for Advanced Gate Stacks with Metal gate and High-k dielectrics,” International Semiconductor Technology Conference, 2005. (Invited)