https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 15:35:422014-09-02 15:36:10“Decoupling of cold carrier effects in hot carrier reliability of HfO2 gated nMOSFETs”, Proc. of IRPS, p.200 , 2006.