https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 10:12:412014-09-02 10:12:47 "Comparative study of TiO2 and Ta2O5 on JVD nitride as an alternative gate dielectrics,” Proceedings of 29th IEEE SISC, p.67, 1998.