https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 14:38:142014-09-02 14:38:17“Cold and Hot Carrier effects on HfO2 and HfSiO NMOSFETS with TiN gate electrode,” Proc. of DRC, 2005.