https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 15:40:172014-09-02 15:40:20“Assessment of Process-Induced Damage in High-κ Transistors”, Proc. of ICICDT, p.1, 2006.