https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 14:34:402014-09-02 14:34:43 “A Study of Charge Trapping Dynamics in HfSiON Dielectrics Using the Single Stage Inverter Circuit,” Proc. of SISC, 2004.