https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 15:54:562014-09-02 15:54:59“A Novel Bias Temperature Instability Characterization Methodology for High-k MOSFETs”, Proc. of ESSDERC, p., 2006.
