https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-02 13:55:152014-09-02 13:56:11 “A Model for Negative Bias Temperature Instability (NBTI) in Oxide and High-k pFETs,” Proc. of Symposium on VLSI Technology, p.208, 2004