https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-01 10:21:302014-09-01 10:21:33"The pulsed Id-Vg methodology and its application to the electron trapping characterization of high-κ gate dielectrics ," J. Semi. Tech. Sci. 10(2), pp.79-99. Jun. 2010.