“Reliability of La-doped Hf-based dielectrics nMOSFETs,” IEEE Trans. Dev. Mat. Reliability, 9(2), p.171, Jun. 2009. 2014년 9월 1일/카테고리: Journals /작성자: exelDownload https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif 0 0 exel https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif exel2014-09-01 10:09:292014-09-01 10:09:35“Reliability of La-doped Hf-based dielectrics nMOSFETs,” IEEE Trans. Dev. Mat. Reliability, 9(2), p.171, Jun. 2009.