https://gistexel.com/wp-content/uploads/2014/08/logo_exel.gif00exelhttps://gistexel.com/wp-content/uploads/2014/08/logo_exel.gifexel2014-09-01 12:53:202014-09-01 12:53:24"Investigation of threshold voltage instability induced by gate bias stress in ZnO nanowire field effect transistors", Nanotechnology, 23, 485201 (2012).